causal claim
Cross-section analysis can locate a defect between layers and help identify the process-flow section where it originated.
Chris Auth · What will computer chips look like in 2045? · 22 Oct 2026
In their words
The transcript segments this claim was taken from
“We'll cross-section it. You were in the, uh, TEM lab yesterday, and you saw how you can get cross-sections. You'll get a cross-section of a defect, and you'll-- from that you'll be able to say, "Oh, that defect is between these layers, so it must have come from this section of the flow.”2:36Report a misattribution
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