descriptive claim
Intel identifies wafer defects using in-line metrology tools.
Chris Auth · What will computer chips look like in 2045? · 22 Oct 2026
In their words
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“Yeah, so there's a, there's a constant process that we go through in identifying defects, and there's, there's kinda two main ways that we'll identify defects. One is we have in-line metrology, so we have tools that will look at the wafers and say, "Ah, there's a defect there, there's a defect there, there's a defect there."”2:12Report a misattribution
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